Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook (in English)
Charles E. Lyman; Dale E. Newbury; Joseph Goldstein; David B. Williams; Alton D. Romig Jr.; John Armstrong; Patrick Echlin; Charles Fiori; David C. Joy; Eric Lifshin; Klaus-RÜDiger Peters
Springer, 1990, 1 edition, Paperback, New