Name: The Certification of 100 mm Diameter Silicon Resistivity SRMs 2531 Through 2547 Using Dual-Configuration Four-Point Probe Measurement, 2006 Edition (in English)
Price: 12.79 USD
Availability: InStock
Author: Department of Commerce
ISBN: 9781494743581

portada The Certification of 100 mm Diameter Silicon Resistivity SRMs 2531 Through 2547 Using Dual-Configuration Four-Point Probe Measurement, 2006 Edition (in English)

Type

Physical Book

Author

Department of Commerce

Publisher

Createspace Independent Publishing Platform

Language

Inglés

Pages

134

Format

Paperback

Dimensions

28.0 x 21.6 x 0.7 cm

Weight

0.33 kg.

ISBN13

9781494743581

Synopsis "The Certification of 100 mm Diameter Silicon Resistivity SRMs 2531 Through 2547 Using Dual-Configuration Four-Point Probe Measurement, 2006 Edition (in English)"

This Special Publication summarizes the certification procedure for a new generation of silicon resistivity Standard Reference Materials 2541 through 2547.

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The Certification of 100 mm Diameter Silicon Resistivity SRMs 2531 Through 2547 Using Dual-Configuration Four-Point Probe Measurement, 2006 Edition (in English) - Department of Commerce

Synopsis "The Certification of 100 mm Diameter Silicon Resistivity SRMs 2531 Through 2547 Using Dual-Configuration Four-Point Probe Measurement, 2006 Edition (in English)"

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