Libros importados hasta 50% OFF + Envío Gratis a todo USA  Ver más

menu

0

My Account

  • argentina
  • chile
  • colombia
  • españa
  • méxico
  • perú
  • estados unidos
  • internacional
portada Structural, Syntactic, and Statistical Pattern Recognition: Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17-19, 2018, Procee (in English)
Type
Physical Book
Publisher
Author
Language
Inglés
Pages
524
Format
Paperback
Dimensions
23.4 x 15.6 x 2.8 cm
Weight
0.75 kg.
ISBN13
9783319977843
Categories

Structural, Syntactic, and Statistical Pattern Recognition: Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17-19, 2018, Procee (in English)

Bai, Xiao ; Hancock, Edwin R. ; Ho, Tin Kam (Author) · Springer · Paperback

Structural, Syntactic, and Statistical Pattern Recognition: Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17-19, 2018, Procee (in English) - Bai, Xiao ; Hancock, Edwin R. ; Ho, Tin Kam

Physical Book

$ 52.09

$ 54.99

You save: $ 2.90

5% discount
Envío gratis a todo Estados Unidos
  • Condition: New

Choose the list to add your product or create one New List

Go to My Wishlists
It will be shipped from our warehouse between Thursday, July 04 and Friday, July 05.
You will receive it anywhere in United States between 1 and 3 business days after shipment.

Synopsis "Structural, Syntactic, and Statistical Pattern Recognition: Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17-19, 2018, Procee (in English)"

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018.The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions. They were organized in topical sections named: classification and clustering; deep learning and neurla networks; dissimilarity representations and Gaussian processes; semi and fully supervised learning methods; spatio-temporal pattern recognition and shape analysis; structural matching; multimedia analysis and understanding; and graph-theoretic methods.

Customers reviews

More customer reviews
  • 0% (0)
  • 0% (0)
  • 0% (0)
  • 0% (0)
  • 0% (0)

Frequently Asked Questions about the Book

Is the book original?

All books in our catalog are Original.

In what language is the book written?

The book is written in English.

What is the format of this book?

The binding of this edition is Paperback.

Questions and Answers about the Book

Do you have a question about the book? Login to be able to add your own question.

Opinions about Bookdelivery

More customer reviews