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portada Strain Effect in Semiconductors: Theory and Device Applications (in English)
Type
Physical Book
Publisher
Language
Inglés
Pages
350
Format
Paperback
Dimensions
23.4 x 15.6 x 1.9 cm
Weight
0.51 kg.
ISBN13
9781489983152

Strain Effect in Semiconductors: Theory and Device Applications (in English)

Yongke Sun (Author) · Scott E. Thompson (Author) · Toshikazu Nishida (Author) · Springer · Paperback

Strain Effect in Semiconductors: Theory and Device Applications (in English) - Sun, Yongke ; Thompson, Scott E. ; Nishida, Toshikazu

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Synopsis "Strain Effect in Semiconductors: Theory and Device Applications (in English)"

Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.

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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.

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