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portada Statistics and Simulation: Iws 8, Vienna, Austria, September 2015 (in English)
Type
Physical Book
Publisher
Language
Inglés
Pages
417
Format
Hardcover
Dimensions
23.4 x 15.6 x 2.4 cm
Weight
0.78 kg.
ISBN13
9783319760346

Statistics and Simulation: Iws 8, Vienna, Austria, September 2015 (in English)

Pilz, Jürgen ; Rasch, Dieter ; Melas, Viatcheslav B. (Author) · Springer · Hardcover

Statistics and Simulation: Iws 8, Vienna, Austria, September 2015 (in English) - Pilz, Jürgen ; Rasch, Dieter ; Melas, Viatcheslav B.

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Synopsis "Statistics and Simulation: Iws 8, Vienna, Austria, September 2015 (in English)"

Preface.- Part I: Invited Papers.- 1. Design and analysis of simulation experiments (Jack P. C. Kleijnen).- 2. A review of simulation usage in the New Zealand electricity market (Golbon Zakeri, Geoff Pritchard).- 3. Power and sample size considerations in psychometrics (Clemens Draxler, Klaus D. Kubinger).- 4. Bootstrap change point testing for dependent data (Zuzana Prásková).- Part II: Simulation for mathematical modeling and analysis.- 5. The covariation matrix of solution of a linear algebraic system by the Monte Carlo method (Tatiana M. Tovstik).- 6. Large-scale simulation of acoustic waves in random multiscale media (Olga N. Soboleva, Ekaterina P. Kurochkina).- 7. Parameter inference for stochastic differential equations with density tracking by quadrature (Harish S. Bhat, R. W. M. A. Madushani, Shagun Rawat).- 8. New Monte Carlo algorithm for evaluation of outgoing polarized radiation (Gennady A. Mikhailov, Natalya V. Tracheva, Sergey A. Ukhinov).- Part III: Simulation for stochastic processes and their applications.- 9. Simulation of stochastic processes with generation and transport of particles (Elena Ermishkina, Elena Yarovaya).- 10. Stochastic models for nonlinear cross-diffusion systems (Yana Belopolskaya).- 11. Benefits and application of tree structures in Gaussian process models to optimize magnetic field shaping problems (Natalie Vollert, Michael Ortner, Jürgen Pilz).- 12. Insurance models under incomplete information (Ekaterina Bulinskaya, Julia Gusak).- 13. Comparison and modeling of pension systems (Christian Quast, Lubos Střelec, Rastislav Potocký, Jozef Kiselák, Milan Stehlík).- 14. Markowitz problem for a case of random environment existence (Alexander Andronov, Tatjana Jurkina).- Part IV: Testing and classification problems in statistics.- 15. Signs of residuals for testing coefficients in quantile regression (Sergey Tarima, Peter Tarassenko, Bonifride Tuyishimire, Rodney Sparapani, Lisa Rein, John Meurer).- 16. Classification of multivariate time series of arbitrary nature based on the ɛ-complexity theory (Boris Darkhovsky, Alexandra Piryatinska).- 17. EEG, nonparametric multivariate statistics, and dementia classification (Patrick Langthaler, Yvonne Höller, Zuzana Hübnerová, Vítězslav Veselý, Arne C. Bathke).- 18. Change point in panel data with small fixed panel size: ratio and non-ratio test statistics(Barbora Pestová, Michal Pesta).- 19. How robust is the two-sample triangular sequential t-test against variance heterogeneity? (Dieter Rasch, Takuya Yanagida).- Part V. Clinical trials and design of experiments.- 20. Performances of Poisson-gamma model for patients' recruitment in clinical trials when there are pauses in recruitment or when the number of centres is small (Nathan Minois, Guillaume Mijoule, Stéphanie Savy, Valérie Lauwers-Cances, Sandrine Andrieu, Nicolas Savy).- 21. Simulated clinical trials: principle, good practices, and focus onvirtual patients generation (Nicolas Savy, Stéphanie Savy, Sandrine Andrieu, Sébastien Marque).- 22. Determination of the optimal size of subsamples for testing a correlation coefficient by a sequential triangular test (Dieter Rasch, Takuya Yanagida, Klaus D. Kubinger, Berthold Schneider).- 23. Explicit T-optimal designs for trigonometric regression models (Viatcheslav B. Melas, Petr V. Shpilev).- 24. Simulations on the combinatorial structure of D-optimal designs (Roberto Fontana, Fabio Rapallo).- Part VI: Simulations for reliability and queueing models.- 25. On the consequences of model misspecification for biased samples from the Weibull distribution (George Tzavelas, Polychronis Economou).-26. An overview on recent advances in statistical burn-in modeling for semiconductor devices (Daniel Kurz, Horst Lewitschnig, Jürgen Pilz).- 27. Simplified analysis of queueing systems with random requirements (Konstantin E. Samouylov, Yuliya V. Gaidamaka, Eduard S. Sopin).- 28. On sensitivity of st

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