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portada Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization (Materials Characterization and Analysis Collection) (in English)
Type
Physical Book
Publisher
Author
Year
2015
Language
English
Pages
178
Format
Paperback
ISBN13
9781606507278
Categories

Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization (Materials Characterization and Analysis Collection) (in English)

Harland G. Tompkins; James N. Hilfiker (Author) · Momentum Press · Paperback

Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization (Materials Characterization and Analysis Collection) (in English) - Harland G. Tompkins; James N. Hilfiker

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