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Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization, Set (in English)
Haight, Richard A. ; Ross, Frances M. ; Hannon, James B. (Author)
·
World Scientific Publishing Company
· Hardcover
Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization, Set (in English) - Haight, Richard A. ; Ross, Frances M. ; Hannon, James B.
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Origin: United Kingdom
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Synopsis "Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization, Set (in English)"
'... These volumes provide the very latest in this critical technology and are an invaluable resource for scientists in both academia and industry concerned with the semiconductor future and all of science.'Foreword by Leonard C Feldman (Director Institute for Advanced Materials, Devices and Nanotechnology, Rutgers University, USA)HighlightsAs we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.
