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portada failure mechanisms in semiconductor devices (in English)
Type
Physical Book
Publisher
Year
1997
Language
Inglés
Pages
358
Format
Hardcover
Dimensions
23.6 x 16.6 x 2.6 cm
Weight
0.62 kg.
ISBN
0471954829
ISBN13
9780471954828
Edition No.
0002

failure mechanisms in semiconductor devices (in English)

E. Ajith Amerasekera (Author) · Farid N. Najm (Author) · Wiley · Hardcover

failure mechanisms in semiconductor devices (in English) - Amerasekera, E. Ajith ; Najm, Farid N.

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Synopsis "failure mechanisms in semiconductor devices (in English)"

In dieser zweiten, aktualisierten Auflage identifizieren die Autoren die Ursachen und Mechanismen, die zu Ausfällen von Halbleiterbauelementen führen. Durch Erkennungsmethoden und Technologien zur Vermeidung von Defekten, die in diesem Buch ausführlich beschrieben werden, wird die Zuverlässigkeit der Bauelemente in der Praxis entscheidend bestimmt.

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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Hardcover.

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