Libros importados hasta 50% OFF + Envío Gratis a todo USA  Ver más

menu

0

My Account

  • argentina
  • chile
  • colombia
  • españa
  • méxico
  • perú
  • estados unidos
  • internacional
portada digital noise monitoring of defect origin (in English)
Type
Physical Book
Publisher
Author
Year
2010
Language
English
Pages
223
ISBN
1441944109
ISBN13
9781441944108
Categories

digital noise monitoring of defect origin (in English)

Aliev, Telman (Author) · springer · Physical Book

digital noise monitoring of defect origin (in English) - aliev, telman

Physical Book

$ 104.20

$ 109.99

You save: $ 5.79

5% discount
Envío gratis a todo Estados Unidos
  • Condition: New

Choose the list to add your product or create one New List

Go to My Wishlists
It will be shipped from our warehouse between Tuesday, July 02 and Wednesday, July 03.
You will receive it anywhere in United States between 1 and 3 business days after shipment.

Customers reviews

More customer reviews
  • 0% (0)
  • 0% (0)
  • 0% (0)
  • 0% (0)
  • 0% (0)

Frequently Asked Questions about the Book

Is the book original?

All books in our catalog are Original.

In what language is the book written?

The book is written in English.

Questions and Answers about the Book

Do you have a question about the book? Login to be able to add your own question.

Opinions about Bookdelivery

More customer reviews